The impact of aging tests on UPS (Uninterruptible Power Supply) reliability can be quantified from three dimensions: "depth of fault prevention", "duration of performance stability", and "upper limit of service life". It is not only a "quality inspection checkpoint" for screening substandard products, but also a core variable that determines whether a UPS can "withstand challenges" in critical scenarios. Its impact can be intuitively reflected through specific data and practical scenarios.

I. From the Perspective of "Early Fault Elimination": Aging Tests Reduce Initial Failure Risk by Over 90%

Approximately 60% of UPS failures are classified as "early failures", caused by component process defects (such as cold soldering, capacitor pin oxidation) and assembly errors (such as loose crimping of wire terminals). These issues are difficult to detect in short-term power-on tests but tend to occur concentratedly within 1-3 months of actual use. However, aging tests, through continuous high-load operation for more than 24 hours, can proactively trigger such hidden faults:

• Data Support: For UPS units without aging tests, the initial failure rate (within 3 months of commissioning) can reach 8%-12%; in contrast, products that undergo standard 24-hour high-temperature full-load aging tests see their initial failure rate drop to below 0.5% (e.g., DaoPulse UPS achieves an early fault detection rate of 99.8% after testing).

• Scenario Impact: In scenarios such as hospital ICUs and core data center rooms, sudden UPS failure due to early faults may lead to medical equipment shutdowns and server data loss, resulting in irreversible losses. Aging tests cut off such risks at the source by eliminating "defective products" in advance.

II. From the Perspective of "Performance Parameter Stability": Aging Tests Improve UPS Long-Term Operation Accuracy by 40%

The core performance indicators of a UPS (such as output voltage stability, power failure switching time, and load adaptability) may fluctuate during the initial operation period due to the "running-in" of components. For example, the capacitance value of a new capacitor gradually stabilizes with power-on time, and the conversion efficiency of an inverter requires a certain period of operation to reach the designed value. The "continuous operation" process of aging tests essentially allows core components to complete the "performance stabilization period" in advance:

• Parameter Comparison: For non-aged UPS units, the output voltage fluctuation range may expand from the designed ±2% to ±3.5% within the initial 1,000 hours of commissioning, and the power failure switching time may delay from ≤10ms to 12-15ms; whereas for aged UPS units, the performance parameter fluctuation can be controlled within ±5% of the designed value within 1,000 hours of commissioning, and the switching time remains stable at ≤10ms.

• Practical Value: For loads with high requirements for power supply accuracy, such as precision manufacturing equipment and laboratory instruments, excessive voltage fluctuations can reduce product yield and cause deviations in experimental data. Aging tests ensure that the UPS operates in the "optimal working state" from the first day of commissioning by stabilizing performance parameters in advance.

III. From the Perspective of "Service Life Guarantee": Aging Tests Extend UPS Effective Service Life by 20%-30%

The service life of a UPS is directly affected by the wear rate of core components (such as inverters, batteries, and heat dissipation systems). Hidden risks under "high temperature + high load" conditions (such as blocked heat dissipation air ducts and unbalanced battery cells) accelerate component aging. While simulating extreme working conditions, aging tests also verify and optimize the system's "anti-wear capability":

• Heat Dissipation System Verification: During aging tests, the temperature of core components is continuously monitored (e.g., inverter module ≤65℃, battery surface ≤45℃). If abnormal temperatures occur, adjustments can be made promptly, such as optimizing the speed of cooling fans and improving air duct design, to prevent shortened component service life due to long-term high temperatures (e.g., the service life of a capacitor at 65℃ is 3 times that at 85℃).

• Battery Balance Guarantee: Through real-time voltage monitoring during the aging process, battery cells with excessive voltage deviations (e.g., single-cell voltage difference >0.05V) can be screened out, avoiding premature scrapping of the entire battery pack due to the "short-board effect" (the service life of an unbalanced battery pack is shortened by 40%).

IV. DaoPulse Practice: How 24-Hour Aging Tests Define the Reliability Benchmark

DaoPulse deeply integrates the impact of aging tests into production. Its testing standard of "50℃ high temperature + 100% full load + dynamic load switching" not only covers the core requirements of conventional aging but also strengthens verification for complex working conditions in actual use:

• Dynamic load switching (100% → 50% → 100% load cycle every 6 hours) simulates load fluctuation scenarios in office and industrial production environments, ensuring stable output of the UPS even when the load changes suddenly;

• The "aging data report" formed by 24-hour continuous monitoring is retained as a "quality file" for each UPS. Users can trace key parameters during the testing process to further verify reliability.

In terms of results, DaoPulse UPS units that undergo this process have a Mean Time Between Failures (MTBF) exceeding 100,000 hours, far higher than the industry average of 60,000-80,000 hours. Behind this achievement is the in-depth empowerment of aging tests on reliability: it transforms "reliability" from an abstract concept into quantifiable and verifiable product strength.

In summary, the impact of aging tests on UPS reliability is not "icing on the cake" but "indispensable". It determines whether a UPS can "avoid breakdowns" at critical moments, whether it can "prevent performance degradation" during long-term use, and more importantly, it defines the "trust threshold" for users regarding power supply guarantees.